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Communication Dans Un Congrès Année : 2024

Correlation Between Conducted Injection and Near-Field Scan Immunity in the L-Band

Alexandre Boyer
Fabien Escudié
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Résumé

Near-Field Scan Immunity (NFSI) is a recent method for analyzing the electromagnetic (EM) susceptibility of an integrated circuit (IC), allowing the study of a system behavior subject to an intentional electromagnetic interference (IEMI). It is a non-intrusive technique that can precisely target component pins that are otherwise inaccessible. This paper compares NFSI to a conducted injection method inspired by the direct power injection (DPI) standard and presents a correlation between the two injection techniques between 500 MHz and 2 GHz. The numerical and experimental validation with different types of near-field probes is validated on passive linear loads.
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Dates et versions

hal-04618394 , version 1 (20-06-2024)

Identifiants

  • HAL Id : hal-04618394 , version 1

Citer

Nicolas Castagnet, Alexandre Boyer, Fabien Escudié. Correlation Between Conducted Injection and Near-Field Scan Immunity in the L-Band. 2024 IEEE International Symposium on Electromagnetic Compatibility and 2024 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa), May 2024, Okinawa, Japan. ⟨hal-04618394⟩
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